Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact - researchr publication

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Sandeep Kumar Goel, Ankita Patidar, Frank Lee. Scan Design Using Unsupervised Machine Learning to Reduce Functional Timing and Area Impact. In IEEE European Test Symposium, ETS 2024, The Hague, Netherlands, May 20-24, 2024. pages 1-4, IEEE, 2024. [doi]

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