Sandeep Kumar Goel, Ankita Patidar, Yue Tian, Frank Lee 0004. Scan Chain Diagnosis in Advanced Process Nodes: The Art of Balancing Resolution, Repairability, and Cost. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 330-338, IEEE, 2025. [doi]
Abstract is missing.