Scan-Path with Directly Duplicated and Inverted Duplicated Registers - researchr publication authors

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Michael Gössel, Egor S. Sogomonyan, Adit D. Singh. Scan-Path with Directly Duplicated and Inverted Duplicated Registers. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 47-52, IEEE Computer Society, 2002. [doi]

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