Michael Gössel, Egor S. Sogomonyan, Adit D. Singh. Scan-Path with Directly Duplicated and Inverted Duplicated Registers. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 47-52, IEEE Computer Society, 2002. [doi]
@inproceedings{GoesselSS02, title = {Scan-Path with Directly Duplicated and Inverted Duplicated Registers}, author = {Michael Gössel and Egor S. Sogomonyan and Adit D. Singh}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/vts/2002/1570/00/15700047abs.htm}, researchr = {https://researchr.org/publication/GoesselSS02}, cites = {0}, citedby = {0}, pages = {47-52}, booktitle = {20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1570-3}, }