Huda Goian, Aamna Alali, Temesghen Habte, Hani H. Saleh. A 65nm ASIC design for measuring mental stress from the heart rate variations. In 24th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2017, Batumi, Georgia, December 5-8, 2017. pages 334-338, IEEE, 2017. [doi]
Abstract is missing.