Use of Silicon-based Sensors for System Reliability Prediction

D. Goloubev, S.-J. Wen, D. Allen, R. Ram, F. Bano, N. Guruswamy, J. Turman. Use of Silicon-based Sensors for System Reliability Prediction. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]

Authors

D. Goloubev

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S.-J. Wen

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D. Allen

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R. Ram

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F. Bano

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N. Guruswamy

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J. Turman

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