Use of Silicon-based Sensors for System Reliability Prediction

D. Goloubev, S.-J. Wen, D. Allen, R. Ram, F. Bano, N. Guruswamy, J. Turman. Use of Silicon-based Sensors for System Reliability Prediction. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]

Abstract

Abstract is missing.