Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy

Séverine Gomès, Pascal Newby, Bruno Canut, Konstantinos Termentzidis, Olivier Marty, Luc Frechette, Patrice Chantrenne, Vincent Aimez, Jean-Marie Bluet, Vladimir Lysenko. Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy. Microelectronics Journal, 44(11):1029-1034, 2013. [doi]

@article{GomesNCTMFCABL13,
  title = {Characterization of the thermal conductivity of insulating thin films by scanning thermal microscopy},
  author = {Séverine Gomès and Pascal Newby and Bruno Canut and Konstantinos Termentzidis and Olivier Marty and Luc Frechette and Patrice Chantrenne and Vincent Aimez and Jean-Marie Bluet and Vladimir Lysenko},
  year = {2013},
  doi = {10.1016/j.mejo.2012.07.006},
  url = {http://dx.doi.org/10.1016/j.mejo.2012.07.006},
  researchr = {https://researchr.org/publication/GomesNCTMFCABL13},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {44},
  number = {11},
  pages = {1029-1034},
}