Andres F. Gomez, Víctor H. Champac. A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging. In 2015 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, South Korea, October 5-7, 2015. pages 297-302, IEEE, 2015. [doi]
Abstract is missing.