Andres F. Gomez, Freddy Forero, Kaushik Roy, Víctor H. Champac. Robust Detection of Bridge Defects in STT-MRAM Cells Under Process Variations. In IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona, Italy, October 8-10, 2018. pages 65-70, IEEE, 2018. [doi]
Abstract is missing.