Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira. Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 216-224, IEEE Computer Society, 2002. [doi]
Abstract is missing.