Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-a-Chip Test Data Compression/Decompression. In 2002 Design, Automation and Test in Europe Conference and Exposition (DATE 2002), 4-8 March 2002, Paris, France. pages 604-611, IEEE Computer Society, 2002. [doi]
Abstract is missing.