Addressing useless test data in core-based system-on-a-chip test

Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola Nicolici. Addressing useless test data in core-based system-on-a-chip test. IEEE Trans. on CAD of Integrated Circuits and Systems, 22(11):1568-1580, 2003. [doi]

Abstract

Abstract is missing.