Study on the electrical breakdown failure mode transition of TSV-RDL - researchr publication authors

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Tao Gong, Si Chen, Kai Li, Guoyuan Li, Zhizhe Wang, Xiaofeng Yang, Xiaodong Jian, Zhiwei Fu. Study on the electrical breakdown failure mode transition of TSV-RDL. Microelectronics Journal, 141:105982, November 2023. [doi]

This author has not been identified. Look up 'Tao Gong' in GoogleThis author has not been identified. Look up 'Si Chen' in GoogleThis author has not been identified. Look up 'Kai Li' in GoogleThis author has not been identified. Look up 'Guoyuan Li' in GoogleThis author has not been identified. Look up 'Zhizhe Wang' in GoogleThis author has not been identified. Look up 'Xiaofeng Yang' in GoogleThis author has not been identified. Look up 'Xiaodong Jian' in GoogleThis author has not been identified. Look up 'Zhiwei Fu' in Google

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