Analysis and optimization of leakage current characteristics in sub-65 nm dual V::t:: footed domino circuits

Na Gong, Baozeng Guo, Jianzhong Lou, Jinhui Wang. Analysis and optimization of leakage current characteristics in sub-65 nm dual V::t:: footed domino circuits. Microelectronics Journal, 39(9):1149-1155, 2008. [doi]

Abstract

Abstract is missing.