DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability - researchr publication related

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Seong-Lyong Gong, Jungrae Kim, Sangkug Lym, Michael Sullivan, Howard David, Mattan Erez. DUO: Exposing On-Chip Redundancy to Rank-Level ECC for High Reliability. In IEEE International Symposium on High Performance Computer Architecture, HPCA 2018, Vienna, Austria, February 24-28, 2018. pages 683-695, IEEE Computer Society, 2018. [doi]

The following publications are possibly variants of this publication:

Improving the reliability of on-chip L2 cache using redundancyKoustav Bhattacharya, Soontae Kim, Nagarajan Ranganathan. iccd 2007: 224-229 [doi]

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