Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs

Carlos J. Gonzalez, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electronic Testing, 37(3):329-343, 2021. [doi]

Authors

Carlos J. Gonzalez

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Bruno L. Costa

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Diego N. Machado

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Rafael Galhardo Vaz

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Alexis C. Vilas Bôas

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Odair Lelis Gonçalez

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Helmut Puchner

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Fernanda Lima Kastensmidt

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Nilberto H. Medina

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Marcilei Aparecida Guazzelli

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Tiago Roberto Balen

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