Carlos J. Gonzalez, Bruno L. Costa, Diego N. Machado, Rafael Galhardo Vaz, Alexis C. Vilas Bôas, Odair Lelis Gonçalez, Helmut Puchner, Fernanda Lima Kastensmidt, Nilberto H. Medina, Marcilei Aparecida Guazzelli, Tiago Roberto Balen. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs. J. Electronic Testing, 37(3):329-343, 2021. [doi]
@article{GonzalezCMVBGPK21,
title = {Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs},
author = {Carlos J. Gonzalez and Bruno L. Costa and Diego N. Machado and Rafael Galhardo Vaz and Alexis C. Vilas Bôas and Odair Lelis Gonçalez and Helmut Puchner and Fernanda Lima Kastensmidt and Nilberto H. Medina and Marcilei Aparecida Guazzelli and Tiago Roberto Balen},
year = {2021},
doi = {10.1007/s10836-021-05952-2},
url = {https://doi.org/10.1007/s10836-021-05952-2},
researchr = {https://researchr.org/publication/GonzalezCMVBGPK21},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {37},
number = {3},
pages = {329-343},
}