Mireia Bargallo González, M. Maestro-Izquierdo, Francesca Campabadal, S. Aldana, F. Jiménez-Molinos, Juan Bautista Roldán. Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.