Memory testing with a RISC microcontroller

A. J. van de Goor, Georgi Gaydadjiev, Said Hamdioui. Memory testing with a RISC microcontroller. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 214-219, IEEE, 2010. [doi]

Authors

A. J. van de Goor

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Georgi Gaydadjiev

Identified as Georgi Gaydadjiev

Said Hamdioui

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