A. J. van de Goor, Georgi Gaydadjiev, Said Hamdioui. Memory testing with a RISC microcontroller. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 214-219, IEEE, 2010. [doi]
@inproceedings{GoorGH10,
title = {Memory testing with a RISC microcontroller},
author = {A. J. van de Goor and Georgi Gaydadjiev and Said Hamdioui},
year = {2010},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5457210},
tags = {testing},
researchr = {https://researchr.org/publication/GoorGH10},
cites = {0},
citedby = {0},
pages = {214-219},
booktitle = {Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010},
publisher = {IEEE},
}