Tests for address decoder delay faults in RAMs due to inter-gate opens

A. J. van de Goor, Said Hamdioui, Zaid Al-Ars. Tests for address decoder delay faults in RAMs due to inter-gate opens. In 9th European Test Symposium (ETS 2004), May 23-26, 2004, Ajaccio, France. pages 146-151, IEEE, 2004. [doi]

Abstract

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