A. J. van de Goor, Said Hamdioui, Georgi Gaydadjiev. Using a CISC microcontroller to test embedded memories. In Elena Gramatová, Zdenek Kotásek, Andreas Steininger, Heinrich Theodor Vierhaus, Horst Zimmermann, editors, 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2010, Vienna, Austria, April 14-16, 2010. pages 261-266, IEEE, 2010. [doi]
Abstract is missing.