Functional Testing of Current Microprocessors (applied to the Intel i860:::TM:::) - researchr publication authors

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A. J. van de Goor, Th. J. W. Verhallen. Functional Testing of Current Microprocessors (applied to the Intel i860:::TM:::). In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 684-695, IEEE Computer Society, 1992.

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