A. J. van de Goor, Th. J. W. Verhallen. Functional Testing of Current Microprocessors (applied to the Intel i860:::TM:::). In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 684-695, IEEE Computer Society, 1992.
@inproceedings{GoorV92,
title = {Functional Testing of Current Microprocessors (applied to the Intel i860:::TM:::)},
author = {A. J. van de Goor and Th. J. W. Verhallen},
year = {1992},
tags = {testing},
researchr = {https://researchr.org/publication/GoorV92},
cites = {0},
citedby = {0},
pages = {684-695},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}