A current based self-test methodology for RF front-end circuits

Anand Gopalan, Martin Margala, P. R. Mukund. A current based self-test methodology for RF front-end circuits. Microelectronics Journal, 36(12):1091-1102, 2005. [doi]

Authors

Anand Gopalan

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Martin Margala

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P. R. Mukund

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