Anand Gopalan, Martin Margala, P. R. Mukund. A current based self-test methodology for RF front-end circuits. Microelectronics Journal, 36(12):1091-1102, 2005. [doi]
@article{GopalanMM05,
title = {A current based self-test methodology for RF front-end circuits},
author = {Anand Gopalan and Martin Margala and P. R. Mukund},
year = {2005},
doi = {10.1016/j.mejo.2005.04.064},
url = {http://dx.doi.org/10.1016/j.mejo.2005.04.064},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/GopalanMM05},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {36},
number = {12},
pages = {1091-1102},
}