Ganesh Gore, Patsy Cadareanu, Edouard Giacomin, Pierre-Emmanuel Gaillardon. A Predictive Process Design Kit for Three-Independent-Gate Field-Effect Transistors. In 27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, Cuzco, Peru, October 6-9, 2019. pages 172-177, IEEE, 2019. [doi]
Abstract is missing.