Susumu Goshima, Yuichi Oka, Tokinori Kozawa, Teruo Mori, Yoshimitsu Takeguchi, Yasuhiro Ohno. Diagnostic system for large scale logic cards and LSI'S. In Robert J. Smith II, editor, Proceedings of the 18th Design Automation Conference, DAC '81, Nashville, Tennessee, USA, June 29 - July 1, 1981. pages 256-259, ACM/IEEE, 1981. [doi]
Abstract is missing.