Chattering phenomenon in a high-side gate driver circuit using MOSFET equivalent circuit

Yusuke Goto, Hiroyuki Asahara, Daisuke Ito, Takuji Kousaka. Chattering phenomenon in a high-side gate driver circuit using MOSFET equivalent circuit. In 19th International SoC Design Conference, ISOCC 2022, Gangneung-si, Republic of Korea, October 19-22, 2022. pages 221-222, IEEE, 2022. [doi]

Abstract

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