Y. Goto, K. Ozaki, T. Ishizuka, A. Ito, Y. Furukawa, T. Inagaki. Electron Beam Prober for LSI Testing with 100ps Time Resolution. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 543-549, IEEE Computer Society, 1984.
@inproceedings{GotoOIIFI84,
title = {Electron Beam Prober for LSI Testing with 100ps Time Resolution},
author = {Y. Goto and K. Ozaki and T. Ishizuka and A. Ito and Y. Furukawa and T. Inagaki},
year = {1984},
tags = {testing},
researchr = {https://researchr.org/publication/GotoOIIFI84},
cites = {0},
citedby = {0},
pages = {543-549},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}