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A software technique to improve lifetime of caches containing ultra-leaky SRAM cells caused by within-die V::th:: variation

Maziar Goudarzi, Tohru Ishihara, Hiroto Yasuura. A software technique to improve lifetime of caches containing ultra-leaky SRAM cells caused by within-die V::th:: variation. Microelectronics Journal, 39(12):1797-1808, 2008. [doi]

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