Modified low power scan based technique

M. R. Gowthami, G. Harish, B. V. Bhargav Ram, Siva Sankar Yellampalli. Modified low power scan based technique. In 19th International Symposium on VLSI Design and Test, VDAT 2015, Ahmedabad, India, June 26-29, 2015. pages 1-5, IEEE, 2015. [doi]

Abstract

Abstract is missing.