Test time reduction of successive approximation register A/D converter by selective code measurement - researchr publication authors

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Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag. Test time reduction of successive approximation register A/D converter by selective code measurement. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]

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