Shalabh Goyal, Abhijit Chatterjee, Mike Atia, Howard Iglehart, Chung Yu Chen, Bassem Shenouda, Nash Khouzam, Hosam Haggag. Test time reduction of successive approximation register A/D converter by selective code measurement. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 8, IEEE, 2005. [doi]
@inproceedings{GoyalCAICSKH05,
title = {Test time reduction of successive approximation register A/D converter by selective code measurement},
author = {Shalabh Goyal and Abhijit Chatterjee and Mike Atia and Howard Iglehart and Chung Yu Chen and Bassem Shenouda and Nash Khouzam and Hosam Haggag},
year = {2005},
doi = {10.1109/TEST.2005.1583979},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583979},
researchr = {https://researchr.org/publication/GoyalCAICSKH05},
cites = {0},
citedby = {0},
pages = {8},
booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005},
publisher = {IEEE},
isbn = {0-7803-9038-5},
}