Shalabh Goyal, Abhijit Chatterjee, Yanan Shieh. Enhanced A/D Converter Signal-to-Noise-Ratio Testing in the Presence of Sampling Clock Jitter. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 307-312, IEEE, 2006. [doi]
Abstract is missing.