Shalabh Goyal, Michael Purtell. Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 14-17, IEEE Computer Society, 2005. [doi]
@inproceedings{GoyalP05, title = {Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester}, author = {Shalabh Goyal and Michael Purtell}, year = {2005}, doi = {10.1109/ATS.2005.22}, url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.22}, tags = {testing}, researchr = {https://researchr.org/publication/GoyalP05}, cites = {0}, citedby = {0}, pages = {14-17}, booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-2481-8}, }