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Shalabh Goyal, Michael Purtell. Alternate Test Methodology for High Speed A/D Converter Testing on Low Cost Tester. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 14-17, IEEE Computer Society, 2005. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data ConvertersShalabh Goyal, Abhijit Chatterjee, Michael Purtell. et, 23(1):95-106, 2007. [doi] Low Cost Dynamic Test Methodology for High Precision ΣD ADCsS. Kook, Hyun Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin. ats 2009: 69-74 [doi]
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