Kristian Granhaug, Snorre Aunet. Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 20-28, IEEE Computer Society, 2006. [doi]
@inproceedings{GranhaugA06,
title = {Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates},
author = {Kristian Granhaug and Snorre Aunet},
year = {2006},
doi = {10.1109/DFT.2006.35},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.35},
researchr = {https://researchr.org/publication/GranhaugA06},
cites = {0},
citedby = {0},
pages = {20-28},
booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2706-X},
}