Kristian Granhaug, Snorre Aunet. Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 20-28, IEEE Computer Society, 2006. [doi]
Abstract is missing.