Characterization and modeling of charge trapping: From single defects to devices - researchr publication authors

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Tibor Grasser, G. Rzepa, Michael Waltl, Wolfgang Gös, Karina Rott, Gunnar Andreas Rott, Hans Reisinger, Jacopo Franco, Ben Kaczer. Characterization and modeling of charge trapping: From single defects to devices. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]

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