Tibor Grasser, G. Rzepa, Michael Waltl, Wolfgang Gös, Karina Rott, Gunnar Andreas Rott, Hans Reisinger, Jacopo Franco, Ben Kaczer. Characterization and modeling of charge trapping: From single defects to devices. In 2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014. pages 1-4, IEEE, 2014. [doi]
@inproceedings{GrasserRWGRRRFK14,
title = {Characterization and modeling of charge trapping: From single defects to devices},
author = {Tibor Grasser and G. Rzepa and Michael Waltl and Wolfgang Gös and Karina Rott and Gunnar Andreas Rott and Hans Reisinger and Jacopo Franco and Ben Kaczer},
year = {2014},
doi = {10.1109/ICICDT.2014.6838620},
url = {http://dx.doi.org/10.1109/ICICDT.2014.6838620},
researchr = {https://researchr.org/publication/GrasserRWGRRRFK14},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2014 IEEE International Conference on IC Design & Technology, ICICDT 2014, Austin, TX, USA, May 28-30, 2014},
publisher = {IEEE},
isbn = {978-1-4799-2153-9},
}