Brian Greskamp, Smruti R. Sarangi, Josep Torrellas. Threshold Voltage Variation Effects on Aging-Related Hard Failure Rates. In International Symposium on Circuits and Systems (ISCAS 2007), 27-20 May 2007, New Orleans, Louisiana, USA. pages 1261-1264, IEEE, 2007. [doi]
Abstract is missing.