Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment

Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre. Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. IEEE Trans. Industrial Informatics, 9(1):142-148, 2013. [doi]

Authors

Michelangelo Grosso

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Hipólito Guzmán-Miranda

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Miguel A. Aguirre

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