Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment

Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre. Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. IEEE Trans. Industrial Informatics, 9(1):142-148, 2013. [doi]

@article{GrossoGA13,
  title = {Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment},
  author = {Michelangelo Grosso and Hipólito Guzmán-Miranda and Miguel A. Aguirre},
  year = {2013},
  doi = {10.1109/TII.2012.2226096},
  url = {http://dx.doi.org/10.1109/TII.2012.2226096},
  researchr = {https://researchr.org/publication/GrossoGA13},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {9},
  number = {1},
  pages = {142-148},
}