Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment

Michelangelo Grosso, Hipólito Guzmán-Miranda, Miguel A. Aguirre. Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment. IEEE Trans. Industrial Informatics, 9(1):142-148, 2013. [doi]

Possibly Related Publications

The following publications are possibly variants of this publication: