Joshua Gruenstein, Tao Chen, Neel Doshi, Pulkit Agrawal. Residual Model Learning for Microrobot Control. In IEEE International Conference on Robotics and Automation, ICRA 2021, Xi'an, China, May 30 - June 5, 2021. pages 7219-7226, IEEE, 2021. [doi]
@inproceedings{GruensteinCDA21,
title = {Residual Model Learning for Microrobot Control},
author = {Joshua Gruenstein and Tao Chen and Neel Doshi and Pulkit Agrawal},
year = {2021},
doi = {10.1109/ICRA48506.2021.9560862},
url = {https://doi.org/10.1109/ICRA48506.2021.9560862},
researchr = {https://researchr.org/publication/GruensteinCDA21},
cites = {0},
citedby = {0},
pages = {7219-7226},
booktitle = {IEEE International Conference on Robotics and Automation, ICRA 2021, Xi'an, China, May 30 - June 5, 2021},
publisher = {IEEE},
isbn = {978-1-7281-9077-8},
}