Torsten Grüning, Udo Mahlstedt, Wilfried Daehn, Cengiz Özcan. Accelerated test pattern generation by cone-oriented circuit partitioning. In Gordon Adshead, Jochen A. G. Jess, editors, European Design Automation Conference, EURO-DAC 1990, Glasgow, Scotland, UK, March 12-15, 1990. pages 418-421, IEEE Computer Society, 1990. [doi]
Abstract is missing.