Fast and Automated Electromigration Analysis for CMOS RF PA Design

Junjie Gu, Haipeng Fu, Weicong Na, Qijun Zhang, Jianguo Ma. Fast and Automated Electromigration Analysis for CMOS RF PA Design. J. Electronic Testing, 33(1):133-140, 2017. [doi]

Authors

Junjie Gu

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Haipeng Fu

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Weicong Na

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Qijun Zhang

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Jianguo Ma

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