Junjie Gu, Haipeng Fu, Weicong Na, Qijun Zhang, Jianguo Ma. Fast and Automated Electromigration Analysis for CMOS RF PA Design. J. Electronic Testing, 33(1):133-140, 2017. [doi]
@article{GuFNZM17,
title = {Fast and Automated Electromigration Analysis for CMOS RF PA Design},
author = {Junjie Gu and Haipeng Fu and Weicong Na and Qijun Zhang and Jianguo Ma},
year = {2017},
doi = {10.1007/s10836-016-5639-4},
url = {http://dx.doi.org/10.1007/s10836-016-5639-4},
researchr = {https://researchr.org/publication/GuFNZM17},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {33},
number = {1},
pages = {133-140},
}